GISAXS/GIWAS X-ray Scattering
PV Material and Device Characterization Equipment
Grazing Incidence Small Angle X-ray Scattering (GISAXS) and Grazing Incidence Wide Angle X-ray Scattering (GIWAXS) ar currently utilized to allow the examination of the samples at different depths, and the distinction of the surface scattering contribution from the particles scattering in the bulk. Grazing-incidence small-angle scattering is a scattering technique used to study thin films and nanostructured surfaces.It combines the accessible length scales of Small-angle scattering with the surface sensitivity of grazing incidence diffraction (GID) and can be very useful to characterize the self-assembly and self-organization of growth materials till nanoscale. For that reason it isn't only relevant for existing thin film technologies but also for nanostructures and quantum dot arrays on semiconductor surfaces and the in-situ characterization. It founds application also to ultrathin polymer films, polymer blends, and other self-organized organic nanostructured.
