Characterization of thin film solar cell layers by x-ray based spectroscopy
X-rays interact with matter through photoabsorption, Compton scattering, and Rayleigh scattering. The strength of these interactions depend on the energy of the X-rays and the elemental composition of the material This joint SOPHIA/CHEETAH webinar introduces x-ray (XPS) and UV (UPS) characterization techniques, two powerful spectroscopic tools to investigate solar cell surfaces and interfaces.
The use of photo electron spectroscopy, using x-ray (XPS) and UV (UPS) excitation to characterize thin film solar cell components has been explored by this Sophia@webinar event. Special emphasis is given to the determination of the chemical composition of surfaces and interfaces and on the analysis of band alignments between different layers of thin film devices by UV photo electron spectroscopy. As the HZB operates a synchrotron radiation source BESSY II which is used as a tunable X-ray source for XPS and UPS measurements, a short introduction into synchrotron radiation has also given