Electrical characterization of thin film solar cells and absorbers
|Dr.||Stephan Buecheler||10th May 2017
11:00 –12:10 CEST
|Dr.||Thomas P. Weiss
|EMPA Eidgenössische Materialprüfungs- und Forschungsanstalt - Laboratory for Thin Films & Photovoltaics
Characterization of thin film solar cells exhibits a number of challenges compared to Si solar cells. Recombinative interfaces, band alignment and barriers for example caused by hetero interfaces, may have a great impact on various measurements. Being aware of these complications will help in drawing false conclusions from measurement data.
The course will cover the following topics and analysis procedures
- IV – Current – Voltage: the evaluation of the IV curve in the framework of the 1-diode model. Deviations from the 1-diode model.
- CV – Capacitance voltage: the analysis of the built-in voltage and the doping density by analyzing the voltage dependence of the capacitance
- TAS – Thermal admittance spectroscopy: the detection of deep defects within in the bulk of the absorber and possible barriers in the solar cell structure
Deadline for registration: Tuesday May 9th 14:00
We point out that due to limited seating (max 150) you must register and access will be available on a first come first served basis.
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|11:00 - 11:05||Introduction|
|11:05 - 12:00||Electrical characterization techniques for thin film single-junction solar cells and absorbers|
|12:00 - 12:10||Questions & Comments|