highlights in this page
ECN-cSi Characterization LAB
[Cheetah Partner]
- Electrical and optical characterisation of wafers and solar cells
- in-line imaging
Technical Info
Main features
- Minority carrier lifetime on blocks and wafers (Sinton QSSPC)
- Minority carrier lifetime mapping of wafers (Semilab μW-PCD)
- Sheet resistance mapping of emitters (Sherescan)
- Contact resistancebetween cell metalisation and emitter (Corescan)
- Contact resistance between cell metalisation and emitter (TLM)
- PL and EL (forward and reverse) on wafers and cells
- Spectral response (integral) of cells
- Reflection and transmission of various samples (with SR for IQE)
- IQE mapping at 4 λ values (Semilab LBIC)
- Shunt localisation with lock-in thermography (illuminated, dark forward, dark reverse)
- IV-curve of cells (illuminated and dark, forward and reverse; continuous and flash)
- Pseudo IV of cells (Sinton SunsVoc)
- Spectroscopic ellipsometry on layers (as SiN)
- Bond density measurements in layers such as SiNx:H (FTIR)
- IV-curves of modules (flash)
Limitations or contraints:
- Access to lab and facilities can be allowed with technical and scientific assistance from ECN
Typical services
- Access to characterization equipment in collaboration with technical and scientific assistance:new cells technologies and materials can be tested.. Support will be provided to choose the relevant equipment and to analyze the resulting raw data.
Participation to projects
- All projects that need electrical and optical characterisation of Si materials and cells and modules