European Commission
A EUROPEAN PROJECT SUPPORTED THROUGH
THE SEVENTH FRAMEWORK PROGRAMME
FOR RESEARCH AND TECHNOLOGICAL DEVELOPMENT
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TUT- Electrical, structural and optical characterization of PV materials

[Cheetah Partner]
  • Lab for extensive electrical, structural and optical characterization of PV materials and devices
  • Electrical, structural and optical characterization of materials and devices based on kesterite (CZTS), chalcopyrite (CIGS) and cadmium-telluride (CdT)

Technical Info

MAIN FEATURES:

  • Photoluminescence spectroscopy (Operating temperature region: 8 – 325 K; excitation wavelengths: 325 nm, 441 nm, 405 nm, 658 nm, 532 nm; spectral region: 0.55 eV - 3.45 eV. System components: closed-cycle He-cryostat (Janis), prism/grating monochromator (Horiba FHR640), He-Cd laser (KIMMON IK series), Hamamatsu NIR PMT detector, PMTs for visible and UV spectral region.
  • Micro-Raman/micro-PL spectroscopy (Operating temperature region: 77 – 325 K; excitation wavelengths: 532 nm, 633 nm, 514 nm, Raman shifts from 10 cm-1, spectral region NIR-visible. System components: Horiba LabRam HR800, Renishaw inVia equipped with NeXT filter).
  • Modulation spectroscopy (electroreflectance, photoreflectance) (Operating temperature region: 8 – 325 K. System components: closed-cycle He-cryostat (Janis), prism/grating monochromator (Horiba FHR640), He-Cd laser (KIMMON IK series), Hamamatsu NIR PMT detector, PMTs for visible and UV spectral region).
  • Scanning electron microscopy (System components: Zeiss HR ULTRA 55 SEM equipped with different detectors enabling EDX, WDX, XRF, EBSD, EBIC analysis).
  • X-ray Photoelectron Spectroscopy (System components: Kratos AXIS Ultra DLD enabling XPS and UPS analysis).

 

LIMITATIONS OR CONSTRAINTS :

  • The access will be allowed with technical and scientific assistance from TUT.

 

TYPICAL SERVICES OR RESULTS

  • Identification of recombination mechanisms in semiconductor materials and devices.
  • Identification of materials phase composition
  • Determination of band and defect structure of semiconductor materials
  • Determination of elemental composition of the powders and thin films
  • Determination of quantitative elemental composition of powders and thin films together with the electronic state of elements and empirical formula of compounds

 

Participation to Research Projects:

All the systems have participated and are participating in many national/international (FP7, INTAS projects) projects.

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Links

Equipment & Instruments

PV Technologies

PV RTD Tags

Contacts

Main contact

GROSSBERG Maarja