STOKKAN Gaute

Gaute Stokkan is working in SINTEF as a researcher. Prior to this he as worked in Academia (NTNU) and industry (REC/ScanWafer). He has more than 15 years of experience with PV research and technology. He has published several papers in international journals and conferences, engages in the public debate through popular science publishing, has supervised several  PhD and master students and is a regular reviewer for several scientific journals. The research interest focuses on microstructure of silicon for solar cells; how the microstructure develops and its impact on solar cell properties. The main focus is on multicrystalline silicon, but much of the competence is generic, both general materials technology and other solar cell technologies.

email : Gaute.Stokkan@sintef.no
address :Stiftelsen Sintef | Materials and Chemistry Department | Sustainable Energy Technology | Solar Cell Silicon Unit | P.O. Box 4760 Sluppen | Trondheim | 7465| Norway

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Carrier Density imaging (CDI)

CZ-Czochralski Pullers

Fourier Transform Infrared Spectroscopy (FTIR)

Induction heated furnaces

IR Imaging & Thermography for Solar cells & PV Modules

Mapping of dislocation densities (PVSCAN)

Minority carrier lifetime by Sinton QSSPC

Minority carrier lifetime mapping by µW-PCD

Optical microscopy

Scanning electron microscopy (SEM)

Scanning Electron Microscopy coupled with Energy Dispersive X-ray Spectroscopy (EDX)

Single & Multi-laser LBIC system for solar cells

cSi Wafer Based Technology

Material and Device Characterization

Defect characterisation & Bulk passivation control during solar cell processing

Degradation and reliability of cSi and other inorganic Solar Cells

IR Imaging & Thermography of Materials and devices

Multicrystalline ingot fabrication and defect control

Optical microscopy

Recrystallization of silicon & Ribbon