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Electrical characterization of thin film solar cells and absorbers
CHEETAH WEBINAR
Dr. | Stephan Buecheler | 10th May 2017 11:00 –12:10 CEST |
Dr. | Thomas P. Weiss |
|
EMPA Eidgenössische Materialprüfungs- und Forschungsanstalt - Laboratory for Thin Films & Photovoltaics |
Characterization of thin film solar cells exhibits a number of challenges compared to Si solar cells. Recombinative interfaces, band alignment and barriers for example caused by hetero interfaces, may have a great impact on various measurements. Being aware of these complications will help in drawing false conclusions from measurement data.
The course will cover the following topics and analysis procedures
- IV – Current – Voltage: the evaluation of the IV curve in the framework of the 1-diode model. Deviations from the 1-diode model.
- CV – Capacitance voltage: the analysis of the built-in voltage and the doping density by analyzing the voltage dependence of the capacitance
- TAS – Thermal admittance spectroscopy: the detection of deep defects within in the bulk of the absorber and possible barriers in the solar cell structure
Informations
Contacts to get more information on this event:
Dr. | Stephan Buecheler | EMPA | ||
Dr | Kartsen Bittkau, | FZ-Jülich | ||
Dr. | Franco Roca, | ENEA |
Technical information to register/login
CHEETAH Webinar team |
Agenda
Time | Title | Speakers |
---|---|---|
11:00 - 11:05 | Introduction |
BUECHELER Stephan
|
11:05 - 12:00 | Electrical characterization techniques for thin film single-junction solar cells and absorbers |
WEISS Thomas Paul
|
12:00 - 12:10 | Questions & Comments | |